| S. No. | Name of Equipment |
|---|---|
| 1 | 200 KeV Ion Accelerator System |
| 2 | UV-Vis–NIR Spectrophotometer (Shimadzu, Japan) |
| 3 | C-V Analyzer (Keithley, USA) |
| 4 | Ellipsometer (Sentech, Germany) |
| 5 | Atomic Force Microscope (Bruker, Germany) |
| 6 | XRD with Glancing Angle Attachment (Shimadzu, Japan) |
| 7 | RF and DC Sputtering Unit |
| 8 | Impedance Analyzer (Wayne Kerr Electronics) |
| 9 | Vacuum Coating Unit |
| 10 | Furnace 600°C |
| 11 | Metallurgical Microscope (Leitz, Germany) |
| 12 | Microhardness Tester (UHL, Germany) |
| 13 | Param Shavak |
Haryana
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